Memory test methods – the checkerboard pattern test is commonly used to test which class of memory?

Introduction / Context:
Memory testing uses structured data patterns to uncover specific fault modes. The checkerboard pattern alternates 1s and 0s in adjacent cells to expose coupling, pattern-sensitive, and addressing faults. Knowing which memory this targets helps in diagnostics and production test flows.

Given Data / Assumptions:

• Goal: detect disturbances between neighboring cells and lines.
• Device under test is byte/word-addressable volatile memory.
• Read-back comparison is available at full speed.

Concept / Approach:
The checkerboard test writes 0xAA (10101010) and 0x55 (01010101) patterns across memory, then reads back to detect errors. Because adjacent bits in the same word and adjacent addresses alternate values, the test stresses cell interactions and sense line integrity—classic concerns in RAM arrays. ROM contents are fixed and cannot be overwritten with patterns, making the checkerboard unsuitable there; EEPROM/Flash have limited endurance and slower writes, making the test impractical as a routine screen.

Step-by-Step Solution:

Verification / Alternative check:
Standard RAM test suites (March tests, GALPAT) include checkerboard as a quick screen specifically for RAM fault models.

Why Other Options Are Wrong:
ROM cannot be overwritten; EEPROM/Flash endurance constraints discourage repetitive pattern tests; FPLA is a programmable logic array, not a byte-addressable RAM target.

Common Pitfalls:
Treating checkerboard as sufficient alone; comprehensive testing also includes walking 1/0 and March algorithms.

Final Answer:
RAM