JFET pinch-off behavior (n-channel): At what condition does an n-channel JFET reach pinch-off, meaning further increases in drain-to-source voltage no longer increase the drain current (ID)?

Difficulty: Easy

Correct Answer: the value of VDS at which further increases in VDS will cause no further increase in ID

Explanation:


Introduction / Context:
An n-channel Junction Field-Effect Transistor (JFET) is a depletion-mode device whose channel conductivity is controlled by the reverse-bias on its gate-to-channel PN junction. A key operating point is the pinch-off condition, where the channel is sufficiently depleted so that increasing the drain-to-source voltage (VDS) does not significantly increase the drain current (ID). This question checks your grasp of the JFET output characteristics and the definition of pinch-off in the saturation (constant-current) region.


Given Data / Assumptions:

  • An n-channel JFET operating with gate-to-source voltage VGS fixed (often at or below 0 V).
  • Device modeled under typical small-signal conditions, ignoring channel-length modulation for the ideal definition.
  • Temperature and process variations neglected for clarity.


Concept / Approach:

For a given VGS, as VDS rises, the reverse bias along the channel increases and the channel narrows. At the pinch-off voltage Vp (for that VGS), the channel is just pinched near the drain end and the device enters the so-called saturation or constant-current region: ID remains approximately constant even if VDS increases further.


Step-by-Step Solution:

Fix VGS and slowly increase VDS from a small value.As VDS increases, the depletion region widens more near the drain than the source.At VDS = Vp (for the chosen VGS), the channel just pinches off at the drain end.Beyond this point, ID ≈ constant; further increases in VDS yield little to no increase in ID (ideal model).


Verification / Alternative check:

Inspect a JFET family of output curves (ID vs. VDS for several VGS). Each curve shows a knee where it flattens: that knee corresponds to the onset of pinch-off (saturation region). Measuring ID beyond the knee shows minimal change with VDS.


Why Other Options Are Wrong:

  • VGS-based definitions (options b and d) describe cutoff or transconductance behavior, not the VDS pinch-off onset.
  • VDG (option c) is not the standard defining parameter for the pinch-off condition in output characteristics.
  • ID at threshold (option e) confuses MOSFET terminology with JFET behavior.


Common Pitfalls:

  • Confusing pinch-off (constant-current region) with cutoff (ID ≈ 0).
  • Ignoring channel-length modulation, which causes a slight upward slope in real devices but does not change the basic definition.


Final Answer:

the value of VDS at which further increases in VDS will cause no further increase in ID

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