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CuriousTab

Testing and Troubleshooting problems


  • 1. Which test equipment best allows a comparison between input and output signals?

  • Options
  • A. an oscilloscope
  • B. a logic probe
  • C. a spectrum analyzer
  • D. a multitrace oscilloscope
  • Discuss
  • 2. A series of gradually decreasing sine wave oscillations is called:

  • Options
  • A. ringing
  • B. slew
  • C. overshooting
  • D. undershooting
  • Discuss
  • 3. The ideal test equipment to use for locating shorts in digital circuitry is the ________ and _______.

  • Options
  • A. logic probe, clip
  • B. logic pulser, logic probe
  • C. current tracer, logic pulser
  • D. current tracer, logic clip
  • Discuss
  • 4. The control of digital circuits is usually achieved with _________.

  • Options
  • A. random pulses
  • B. clock signals
  • C. sophisticated gating
  • D. selected frequencies
  • Discuss
  • 5. Erratic or unexplained digital circuit activity is often due to _________.

  • Options
  • A. a glitch
  • B. a random pulse
  • C. clock frequency changes
  • D. a change in slew rate
  • Discuss
  • 6. "Train" and "single" is the mode selection for a _______.

  • Options
  • A. multimeter
  • B. logic probe
  • C. current tracer
  • D. logic pulser
  • Discuss
  • 7. The device that would best aid in open track detection is a(n) ________.

  • Options
  • A. multimeter
  • B. current tracer
  • C. logic probe
  • D. oscilloscope
  • Discuss
  • 8. In order for a logic probe to operate, its red and black leads must first be connected to a ________.

  • Options
  • A. logic clip
  • B. HIGH or TRUE signal
  • C. power source
  • D. logic pulser
  • Discuss
  • 9. The use of a logic probe may be improved through the use of a(n) ________.

  • Options
  • A. logic clip
  • B. frequency counter
  • C. oscilloscope
  • D. current tracer
  • Discuss
  • 10. The results of internal IC failures will usually be noticed during the ______ phase of troubleshooting.

  • Options
  • A. diagnostic
  • B. isolation
  • C. repair
  • D. final test
  • Discuss

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