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Semiconductor Memory problems
1. Which of the following memories uses a MOSFET and a capacitor as its memory cell?
Options
A. SRAM
B. DRAM
C. ROM
D. DROM
Show Answer
Scratch Pad
Discuss
Correct Answer: DRAM
2. The access time (t
acc
) of a memory IC is governed by the IC's:
Options
A. internal address buffer
B. internal address decoder
C. volatility
D. internal address decoder and volatility
Show Answer
Scratch Pad
Discuss
Correct Answer: internal address decoder
3. What is the principal advantage of using address multiplexing with DRAM memory?
Options
A. reduced memory access time
B. reduced requirement for constant refreshing of the memory contents
C. reduced pin count and decrease in package size
D. no requirement for a chip-select input line, thereby reducing the pin count
Show Answer
Scratch Pad
Discuss
Correct Answer: reduced pin count and decrease in package size
4. Advantage(s) of an EEPROM over an EPROM is (are):
Options
A. the EPROM can be erased with ultraviolet light in much less time than an EEPROM
B. the EEPROM can be erased and reprogrammed without removal from the circuit
C. the EEPROM has the ability to erase and reprogram individual words
D. the EEPROM can erase and reprogram individual words without removal from the circuit
Show Answer
Scratch Pad
Discuss
Correct Answer: the EEPROM can erase and reprogram individual words without removal from the circuit
5. Which of the following best describes nonvolatile memory?
Options
A. memory that retains stored information when electrical power is removed
B. memory that loses stored information when electrical power is removed
C. magnetic memory
D. nonmagnetic memory
Show Answer
Scratch Pad
Discuss
Correct Answer: memory that retains stored information when electrical power is removed
6. Select the best description of read-only memory (ROM).
Options
A. nonvolatile, used to store information that changes during system operation
B. nonvolatile, used to store information that does not change during system operation
C. volatile, used to store information that changes during system operation
D. volatile, used to store information that does not change during system operation
Show Answer
Scratch Pad
Discuss
Correct Answer: nonvolatile, used to store information that does not change during system operation
7. A computerized self-diagnostic for a ROM test uses:
Options
A. the check-sum method
B. a ROM listing
C. ROM comparisons
D. a checkerboard test
Show Answer
Scratch Pad
Discuss
Correct Answer: the check-sum method
8. Memory that loses its contents when power is lost is:
Options
A. nonvolatile
B. volatile
C. random
D. static
Show Answer
Scratch Pad
Discuss
Correct Answer: volatile
9. Select the best description of the fusible-link PROM.
Options
A. user programmable, one-time programmable
B. manufacturer programmable, one-time programmable
C. user programmable, reprogrammable
D. manufacturer programmable, reprogrammable
Show Answer
Scratch Pad
Discuss
Correct Answer: user programmable, one-time programmable
10. Which of the following RAM timing parameters determine(s) its operating speed?
Options
A. t
acc
B. t
aa
and t
acs
C. t
1
and t
3
D. t
rc
and t
wc
Show Answer
Scratch Pad
Discuss
Correct Answer: t
1
and t
3
First
2
3
4
More in Electronics:
Alternating Current and Voltage
Alternating Current vs Direct Current
Analog and Digital Converters
Analog to Digital
Arithmetic Operations and Circuits
Basic Op-Amp Circuits
Bipolar Junction Transistors (BJT)
Capacitors
Combinational Logic Circuits
Computer Hardware and Software
Diodes and Applications
Field Effect Transistors (FET)
Flip-Flops and Timers
Inductors
Logic Circuit Simplification
Logic Gates
Magnetism and Electromagnetism
Measurement, Conversion and Control
Number Systems and Codes
Ohm's Law
Operational Amplifiers
Parallel Circuits
Programmable Logic Devices (PLD)
Quantities and Units
RC Circuits
Resistance and Power
RL Circuits
RLC Circuits and Resonance
Semiconductor Memory
Semiconductor Principles
Sequential Logic Circuits
Series-Parallel Circuits
Series Circuits
Special-Purpose Op-Amp Circuits
Standard Logic Devices (SLD)
Testing and Troubleshooting
Thyristors and Tranducers
Time Response of Reactive Circuits
Transformers
Transistors and Applications
Voltage and Current